Electron and Ion Beam Characterization

Coursera MOOC / Non-credit USD 49

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Electron and Ion Beam Characterization

About this course

Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices. They can be used to image structures with sub-nm resolution and to provide information about elemental composition and dopant concentration. This course describes the fundamentals of electron and ion beam characterization and includes a project that analyzes the surface roughness of a solar cell.

What you'll learn

understand electron and ion beam principles
analyze semiconductor materials
perform sub-nanometer imaging
evaluate elemental composition and dopant concentration
assess surface roughness of solar cells

Skills you'll gain

quantitative analysis electron beams ion beams semiconductor analysis surface roughness material characterization elemental composition sub-nm imaging solar cell analysis

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